Nexperia's newly expanded NextPower 80/100V MOSFETs portfolio offers increased design flexibility
Nexperia announced that it is continuing to expand its NextPower 80 V and 100 V MOSFETs portfolio with the introduction of several new LFPAK devices in the industry standard 5x6 mm and 8x8 mm sizes. Optimized for low RDS(on) and low Qrr, these new NextPower 80/100 V MOSFETs provide high efficiency and low spikes in a variety of applications such as servers, power supplies, fast chargers, and USB-PD, as well as in a wide range of telecommunications, motor control, and other industrial equipment. Designers can choose between 80 V and 100 V devices, with RDS(on) selections ranging from 1.8 mΩ to 15 mΩ.
Many MOSFET manufacturers compare the switching performance of their devices to other products with a particular focus on achieving high efficiency through low QG(tot) and low QGD. However, through extensive research, Nexperia found that Qrr is just as important because it affects spike performance, which in turn affects the amount of electromagnetic interference (EMI) generated during device switching.
By focusing on this parameter, Nexperia has significantly reduced the level of spikes produced by its NextPower family of 80/100 V MOSFETs, while also reducing the amount of EMI they produce. If an end-user application fails electromagnetic compatibility (EMC) testing at a later stage and needs to be redesigned, this will bring significant benefits to the end user by reducing the high cost of adding additional external components.
These new MOSFETs reduce on-resistance (RDSon) by up to 31% compared to currently available devices. Nexperia also plans to further strengthen its NextPower 80/100 V portfolio later this year with the release of an LFPAK88 MOSFET that delivers RDS(on) as low as 1.2 mΩ at 80 V, while introducing the power-intensive CCPAK1212 into the portfolio. To further support the design import and validation of these devices, Nexperia's award-winning interactive data book provides engineers with comprehensive and user-friendly analysis of device behavior.
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