SN74LVTH18646APM
For Reference Only
Part Number | SN74LVTH18646APM | ||||||||||||||||||
PNEDA Part # | SN74LVTH18646APM | ||||||||||||||||||
Description | IC SCAN-TEST-DEV/XCVR 64-LQFP | ||||||||||||||||||
Manufacturer | Texas Instruments | ||||||||||||||||||
Unit Price |
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In Stock | 8,970 | ||||||||||||||||||
Warehouses | Shipped from Hong Kong SAR | ||||||||||||||||||
Estimated Delivery | Nov 26 - Dec 1 (Choose Expedited Shipping) | ||||||||||||||||||
Guarantee | Up to 1 year [PNEDA-Warranty]* | ||||||||||||||||||
Free shipping on orders over $100. PNEDA is willing to provide you with better services.
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SN74LVTH18646APM Resources
Brand | Texas Instruments |
ECAD Module | |
Mfr. Part Number | SN74LVTH18646APM |
Category | Semiconductors › Logic ICs › Logic - Specialty Logic |
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SN74LVTH18646APM Specifications
Manufacturer | |
Series | 74LVTH |
Logic Type | ABT Scan Test Device With Transceivers and Registers |
Supply Voltage | 2.7V ~ 3.6V |
Number of Bits | 18 |
Operating Temperature | -40°C ~ 85°C |
Mounting Type | Surface Mount |
Package / Case | 64-LQFP |
Supplier Device Package | 64-LQFP (10x10) |
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