SN74LVTH182512DGGR
For Reference Only
Part Number | SN74LVTH182512DGGR |
PNEDA Part # | SN74LVTH182512DGGR |
Description | IC SCAN-TEST-DEV/XCVR 64-TSSOP |
Manufacturer | Texas Instruments |
Unit Price | Request a Quote |
In Stock | 4,932 |
Warehouses | Shipped from Hong Kong SAR |
Estimated Delivery | Nov 23 - Nov 28 (Choose Expedited Shipping) |
Guarantee | Up to 1 year [PNEDA-Warranty]* |
Free shipping on orders over $100. PNEDA is willing to provide you with better services.
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SN74LVTH182512DGGR Resources
Brand | Texas Instruments |
ECAD Module | |
Mfr. Part Number | SN74LVTH182512DGGR |
Category | Semiconductors › Logic ICs › Logic - Specialty Logic |
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SN74LVTH182512DGGR Specifications
Manufacturer | |
Series | 74LVTH |
Logic Type | ABT Scan Test Device With Universal Bus Transceivers |
Supply Voltage | 2.7V ~ 3.6V |
Number of Bits | 18 |
Operating Temperature | -40°C ~ 85°C |
Mounting Type | Surface Mount |
Package / Case | 64-TFSOP (0.240", 6.10mm Width) |
Supplier Device Package | 64-TSSOP |
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