SN74ABT8952DW
For Reference Only
| Part Number | SN74ABT8952DW |
| PNEDA Part # | SN74ABT8952DW |
| Description | IC SCAN-TEST-DEV/XCVR 28-SOIC |
| Manufacturer | Texas Instruments |
| Unit Price | Request a Quote |
| In Stock | 5,004 |
| Warehouses | Shipped from Hong Kong SAR |
| Estimated Delivery | Apr 3 - Apr 8 (Choose Expedited Shipping) |
| Guarantee | Up to 1 year [PNEDA-Warranty]* |
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Free shipping on orders over $100. PNEDA is willing to provide you with better services.
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SN74ABT8952DW Resources
| Brand | Texas Instruments |
| ECAD Module |
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| Mfr. Part Number | SN74ABT8952DW |
| Category | Semiconductors › Logic ICs › Logic - Specialty Logic |
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SN74ABT8952DW Specifications
| Manufacturer | |
| Series | 74ABT |
| Logic Type | Scan Test Device with Registered Bus Transceiver |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Operating Temperature | -40°C ~ 85°C |
| Mounting Type | Surface Mount |
| Package / Case | 28-SOIC (0.295", 7.50mm Width) |
| Supplier Device Package | 28-SOIC |
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