8V18646AIPMREP
For Reference Only
| Part Number | 8V18646AIPMREP |
| PNEDA Part # | 8V18646AIPMREP |
| Description | IC ABT SCAN TEST DEV 3.3V 64LQFP |
| Manufacturer | Texas Instruments |
| Unit Price | Request a Quote |
| In Stock | 2,034 |
| Warehouses | Shipped from Hong Kong SAR |
| Estimated Delivery | Mar 31 - Apr 5 (Choose Expedited Shipping) |
| Guarantee | Up to 1 year [PNEDA-Warranty]* |
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Free shipping on orders over $100. PNEDA is willing to provide you with better services.
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8V18646AIPMREP Resources
| Brand | Texas Instruments |
| ECAD Module |
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| Mfr. Part Number | 8V18646AIPMREP |
| Category | Semiconductors › Interface ICs › Interface - Specialized |
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Logistics Mode
- Delivery time: At the same day (Order deadline is 2pm, HK Time).
- Delivery date: usually 2 to 7 working days.
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Notes
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8V18646AIPMREP Specifications
| Manufacturer | |
| Series | SCOPE™, Widebus™ |
| Applications | Circuit Board Testing |
| Interface | 4-Wire Test Access Port (TAP) |
| Voltage - Supply | 2.7V ~ 3.6V |
| Package / Case | 64-LQFP |
| Supplier Device Package | 64-LQFP (10x10) |
| Mounting Type | Surface Mount |
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